TPD5E003 Datasheet, PDF (1/10 Pages) Texas Instruments – Five Channel Space Saving ESD Protection Device

TPD5E003
www.ti.com
SLVSBQ6A – DECEMBER 2012 – REVISED JANUARY 2013
Five Channel Space Saving ESD Protection Device
Check for Samples: TPD5E003
FEATURES
1
APPLICATIONS
• Provides System Level ESD Protection for
Low-Voltage IO Interface
• IEC 61000-4-2 Level 4
– ±15kV (Contact discharge)
– ±15kV (Air-gap discharge)
• Typical IO Capacitance 7pF (V_IO = 2.5V)
• DC Breakdown Voltage 6V (Min)
• Low Leakage Current 100nA (Max)
• SIM Card
• Side Keys
• Audio Interface
• Memory Card
DPF
1
6
• Low ESD Clamping Voltage
• Industrial Temperature Range: –40°C to 125°C
2
5
• IEC 61000-4-5 (Surge): 40 W (8/20 µs Pulse)
• Small, Easy-to-Route DPF Package
3
4
1 mm x 1 mm x 0.4mm
(0.35-mm pitch)
DESCRIPTION
The TPD5E003 is a five channel ESD protection device. It offers ±15KV IEC contact and ±15KV air-gap ESD
protection. It features five identical ESD clamping diodes that could be used for either five unidirectional (0V to
5V) I/O lines or four bidirectional (-5V to 5V) I/O lines. The lower IO capacitance is suitable for a wide range of
applications. Typical application areas include audio lines (mic, earphone, and speakerphone), SD interface, and
keypad, or other buttons.
T_A
–40°C to 125°C
ORDERING INFORMATION
PACKAGE ^{(1) (2)}
ORDERABLE PART NUMBER
5000
Tape and reel
TPD5E003DPFR
TOP-SIDE MARKING
9Q
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012–2013, Texas Instruments Incorporated