TPD4F202 Datasheet, PDF (1/11 Pages) Texas Instruments – FOUR,SIX-CHANNEL EMI FILTER WITH ESD PROTECTION FOR LCD DISPLAY

TPD4F202, TPD6F202
www.ti.com
SLLS800 – JUNE 2010
FOUR-, SIX-CHANNEL EMI FILTER WITH ESD PROTECTION FOR LCD DISPLAY
Check for Samples: TPD4F202, TPD6F202
FEATURES
1
• Four-, Six-Channel EMI Filtering and ESD
Protection for Data Lines
• Excellent filter Performance
– >40dB Attenuation at 1GHz-3GHz
– -3dB Bandwidth at 108MHz
– 70 dB Crosstalk Attenuation at 100 MHz
• Exceeds IEC61000-4-2 (Level 4) ESD
Protection Requirements
– ±25-kV IEC 61000-4-2 Contact Discharge
– ±25-kV IEC 61000-4-2 Air-Gap Discharge
– ±15-kV Human-Body Model (HBM)
• Pi-Style C-R-C Filter Configuration Offers
Symmetric Filter Performance
TPD4F202
YFU PACKAGE
(R = 100 Ω, C_TOTAL = 30 pF)
• Low 10-nA Leakage Current
• Space-Saving WCSP Package and
Flow-Through Pin Mapping Provides Optimum
Performance in Portable Applications
APPLICATIONS
• LCD Display Interface
• Memory Interface
• SVGA Video Connections
• Keypad
• Data Lines in Portables
TPD6F202
YFU PACKAGE
T_A
–40°C to 85°C
PACKAGE^{(1) (2)}
WCSP – YFU
ORDERING INFORMATION
PACKAGE DIMENSION
ORDERABLE
PART NUMBER
Length = 2.36 mm, Width = 1.053 mm,
Pitch = 0.4 mm, Height = 0.32 mm)
TPD6F202YFUR
Length = 1.56 mm, Width = 1.053 mm,
Pitch = 0.4 mm, Height = 0.32 mm)
TPD4F202YFUR
TOP-SIDE MARKING
YMS5WS
YMS57S
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated