TPA4411 Datasheet, PDF (1/21 Pages) Texas Instruments – 80-mW CAPLESS STEREO HEADPHONE DRIVER

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80-mW CAPLESS STEREO HEADPHONE DRIVER
TPA4411
SLOS430 – AUGUST 2004
FEATURES
• Ground-Referenced Outputs Eliminate
DC-Bias Voltages on Headphone Ground Pin
– No Output DC-Blocking Capacitors
• Reduced Board Area
• Reduced Component Cost
• Improved THD+N Performance
• No Degradation of Low-Frequency
Response Due to Output Capacitors
• Wide Power Supply Range: 1.8 V to 4.5 V
• 80-mW/Ch Output Power into 16-Ω at 4.5 V
• Independent Right and Left Channel
Shutdown Control
• Short-Circuit and Thermal Protection
• Pop Reduction Circuitry
• Space Saving Pb-Free Packages
– 20-pin, 4 mm × 4 mm ThinQFN
– 16-ball, 2 mm × 2 mm WCSP
(Product Preview)
.
TLV320AIC26
or
TLV320AIC28
HPL
or
SPK1
HPR
or
SPK2
APPLICATIONS
• Notebook Computers
• CD / MP3 Players
• Smart Phones
• Cellular Phones
• PDAs
DESCRIPTION
The TPA4411 is a stereo headphone driver designed
to allow the removal of the output dc-blocking capaci-
tors for reduced component count and cost. The
TPA4411 is ideal for small portable electronics where
size and cost are critical design parameters.
The TPA4411 is capable of driving 80 mW into a
16-Ω load at 4.5 V. The TPA4411 has a fixed gain of
-1.5 V/V and headphone outputs have ±8-kV IEC
ESD protection. The TPA4411 has independent shut-
down control for the right and left audio channels.
The TPA4411 is available in a 20-pin, 4 mm × 4 mm
ThinQFN package.
TPA2012D2
Shutdown
Control
1.8 − 4.5 V
SDL
PGND
SDR
INR
TPA4411
SGND
OUTL
INL
PV_DD
OUTR
PV_SS
SV_SS
SV_DD
C1P C1N
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRO-
DUCTION DATA information current as of publication date. Prod-
ucts conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily
include testing of all parameters.
Copyright © 2004, Texas Instruments Incorporated