TPA2011D1 Datasheet, PDF (1/23 Pages) Texas Instruments – 3.2W Mono Filter-Free Class-D Audio Power Amplifier With Auto-Recovering Short-Circuit Protection

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TPA2011D1
SLOS626 – DECEMBER 2009
3.2W Mono Filter-Free Class-D Audio Power Amplifier
With Auto-Recovering Short-Circuit Protection
Check for Samples: TPA2011D1
FEATURES
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• Powerful Mono Class-D Amplifier
– 3.24 W (4 Ω, 5 V, 10% THDN)
– 2.57 W (4 Ω, 5 V, 1% THDN)
– 1.80 W (8 Ω, 5 V, 10% THDN)
– 1.46 W (8 Ω, 5 V, 1% THDN)
• Integrated Feedback Resistor of 300 kΩ
• Integrated Image Reject Filter for DAC Noise
Reduction
• Low Output Noise of 20 μV
• Low Quiescent Current of 1.5 mA
• Auto Recovering Short-Circuit Protection
• Thermal Overload Protection
• 9-Ball, 1,21mm x 1,16 mm 0,4 mm Pitch WCSP
DESCRIPTION
The TPA2011D1 is a 3.2-W high efficiency filter-free
class-D audio power amplifier (class-D amp) in a
1,21 mm × 1,16 mm wafer chip scale package
(WCSP) that requires only three external
components.
Features like 95% efficiency, 86-dB PSRR, 1.5 mA
quiescent current and improved RF immunity make
the TPA2011D1 class-D amp ideal for cellular
handsets. A fast start-up time of 4 ms with no audible
turn-on pop makes the TPA2011D1 ideal for PDA
and smart-phone applications. The TPA2011D1
allows independent gain while summing signals from
separate sources, and has a low 20 μV noise floor.
APPLICATIONS
• Wireless or Cellular Handsets and PDAs
• Portable Navigation Devices
• General Portable Audio Devices
APPLICATION CIRCUIT
TPA 2011D1
9-BALL 0.4mm PITCH
WAFER CHIP SCALE PACKAGE (YFF)
(TOP VIEW OF PCB)
IN+
GND
V_O-
A1
A2
A3
EN
TPA2011D1
VDD
PVDD
PGND
B1
B2
B3
IN-
EN
V_O+
C1
C2
C3
1.214 mm
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated