English
Language : 

TMS470R1VF4B8 Datasheet, PDF (1/60 Pages) Texas Instruments – 16/32-BIT RISC FLASH MICROCONTROLLER
TMS470R1VF4B8
16/32-BIT RISC FLASH MICROCONTROLLER
z High-Performance Static CMOS Technology
z TMS470R1x 16/32-Bit RISC Core (ARM7TDMI™)
– 24-MHz System Clock (64-MHz Pipeline
Mode)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
z Integrated Memory
– 256K-Byte Program Flash
– One Bank With 10 Contiguous Sectors
– 16K-Byte Static RAM (SRAM)
z Operating Features
– Core Supply Voltage (VCC): 1.81 V - 2.06 V
– Core Supply Voltage (VCC): 1.70 V - 2.06 V
When Used At or Below 56MHz, 85C Ambient
Temp, and 115C Junction Temp
– I/O Supply Voltage (VCCIO): 3.0 V - 3.6 V
– Low-Power Modes: STANDBY and HALT
– Industrial/Automotive Temperature Ranges
z 470+ System Module
– 32-Bit Address Space Decoding
– Bus Supervision for Memory/Peripherals
– Digital Watchdog (DWD) Timer
– Enhanced Real-Time Interrupt (RTI)
– System Integrity and Failure Detection
z Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
z Six Communication Interfaces:
– Serial Peripheral Interface (SPI)
– 255 Programmable Baud Rates
– Two Serial Communication Interfaces (SCIs)
– 224 Selectable Baud Rates
– Asynchronous/Isosynchronous Modes
– Two Standard CAN Controllers (SCC)
– 16-Mailbox Capacity
– Fully Compliant With CAN Protocol,
Version 2.0B
– Multi-Buffered Serial Peripheral Interface
(MibSPI)
– 64-Word Buffer
– Eight Chip Selects
z High-End Timer (HET)
SPNS094C – JUNE 2004 – REVISED AUGUST 2006
– 9 Programmable I/O Channels:
– 7 High-Resolution Pins
– High-Resolution Share Feature (XOR)
– High-End Timer RAM
– 128-Instruction Capacity
z External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
z 16-Channel 10-Bit Multi-Buffered ADC
(MibADC)
– 64-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 μs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
z 10 Dedicated General-Purpose I/O (GIO) Pins
and 37 Additional Peripheral I/Os
z Eight External Interrupts
z Flexible Interrupt Handling
z Compatible ROM Device (Planned)
z On-Chip Scan-Base Emulation Logic,
IEEE Standard 1149.1† (JTAG) Test-Access Port
z 100-Pin Plastic Low-Profile Quad Flatpack
z Development System Support Tools Available
– Code Composer Studio™ Integrated Devel-
opment Environment (IDE)
– HET Assembler and Simulator
– Real-Time In-Circuit Emulation
– Flash Programming
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
TexasInstruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Code Composer Studio is a trademark of Texas Instruments.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
All trademarks are the property of their respective owners.
† The test-access port is compatible with the IEEE Standard 1149.1-1990, IEEE Standard Test-Access Port and Boundary Scan Architecture
specification. Boundary scan is not supported on this device.
PRODUCTION DATA information is current as of publication
date. Products conform to specifications per the Texas
Instruments standard warranty. Production processing does
not necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251-1443
1