TMS470R1B512 Datasheet, PDF (1/46 Pages) Texas Instruments – 16/32-Bit RISC Flash Microcontroller

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FEATURES
• High-Performance Static CMOS Technology
• TMS470R1x 16/32-Bit RISC Core
(ARM7TDMI™)
– 24-MHz System Clock (60-MHz Pipeline
Mode)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
– Utilizes Big-Endian Format
• Integrated Memory
– 512K-Byte Program Flash
• 2 Banks With 14 Contiguous Sectors
• Internal State Machine for Programming
and Erase
– 32K-Byte Static RAM (SRAM)
• 27 Dedicated GIO Pins, 1 Input-Only GIO Pin,
and 59 Additional Peripheral I/Os
• Operating Features
– Core Supply Voltage (V CC ): 1.81 V – 2.05 V
– I/O Supply Voltage (VCCIO): 3.0 V – 3.6 V
– Low-Power Modes: STANDBY and HALT
– Extended Industrial Temperature Range
• 470+ System Module
– 32-Bit Address Space Decoding
– Bus Supervision for Memory and
Peripherals
– Analog Watchdog (AWD) Timer
– Real-Time Interrupt (RTI)
– System Integrity and Failure Detection
– Interrupt Expansion Module (IEM)
• Direct Memory Access (DMA) Controller
– 32 Control Packets and 16 Channels
• Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
TMS470R1B512
16/32-Bit RISC Flash Microcontroller
SPNS107 – SEPTEMBER 2005
• External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
• Seven Communication Interfaces:
– Three Serial Peripheral Interfaces (SPIs)
• 255 Programmable Baud Rates
– Two Serial Communications Interfaces
(SCIs)
• 2²⁴ Selectable Baud Rates
• Asynchronous/Isosynchronous Modes
• Two High-End CAN Controllers (HECCs)
• 32-Mailbox Capacity Each
• Fully Compliant With CAN Protocol,
Version 2.0B
• High-End Timer (HET)
– 32 Programmable I/O Channels:
• 24 High-Resolution Pins
• 8 Standard-Resolution Pins
– High-Resolution Share Feature (XOR)
– High-End Timer RAM
• 128-Instruction Capacity
• 16-Channel 10-Bit Multi-Buffered ADC
(MibADC)
– 128-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 µs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
• Eight External Interrupts
• Flexible Interrupt Handling
• On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1⁽¹⁾ (JTAG) Test-Access Port
• 144-Pin Plastic Low-Profile Quad Flatpack
(PGE Suffix)
(1) _{The test-access port is compatible with the IEEE Standard}
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not
supported on this device.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
All trademarks are the property of their respective owners.
ADVANCE INFORMATION concerns new products in the sampling
or preproduction phase of development. Characteristic data and
other specifications are subject to change without notice.
Copyright © 2005, Texas Instruments Incorporated