TMS28F512A Datasheet, PDF (1/21 Pages) Texas Instruments – 65536 BY 8-BIT FLASH MEMORY

D Organization . . . 65 536 by 8 Bits
D All Inputs / Outputs TTL-Compatible
D V_CC Tolerance ±10%
D Maximum Access / Minimum Cycle Time
’28F512A-10
100 ns
’28F512A-12
120 ns
’28F512A-15
150 ns
’28F512A-17
170 ns
D Industry-Standard Programming Algorithm
D 10000 and 1 000 Program / Erase Cycles
D Latchup Immunity of 250 mA on all Input
and Output Lines
D Low Power Dissipation ( V_CC = 5.5 V )
– Active Write . . . 55 mW
– Active Read . . . 165 mW
– Electrical Erase . . . 82.5 mW
– Standby . . . 0.55 mW
(CMOS-Input Levels)
D Automotive Temperature Range
– 40°C to 125°C
description
The TMS28F512A Flash memory is a 65 536 by
8-bit (524 288-bit), programmable read-only
memory that can be electrically bulk-erased and
reprogrammed. It is available in 10 000 and 1 000
program / erase endurance cycle versions.
The TMS28F512A is offered in a 32-lead plastic
leaded chip-carrier package with 1,25-mm
(50-mil) lead spacing (FM suffix).
The TMS28F512A is characterized for operation
in temperature ranges of 0°C to 70°C (FML suffix),
– 40°C to 85°C ( FME suffix), and – 40°C to 125°C
( FMQ suffix).
TMS28F512A
65536 BY 8-BIT
FLASH MEMORY
SMJS514C – FEBRUARY 1994 – REVISED AUGUST 1997
FM PACKAGE
( TOP VIEW )
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
4 3 2 1 32 31 30
5
29
6
28
7
27
8
26
9
25
10
24
11
23
12
22
13
21
14 15 16 17 18 19 20
A14
A13
A8
A9
A11
G
A10
E
DQ7
PIN NOMENCLATURE
A0 – A15
DQ0 – DQ7
E
G
NC
VCC
VPP
VSS
W
Address Inputs
Inputs (programming) / Outputs
Chip Enable
Output Enable
No Internal Connection
5-V Power Supply
12-V Power Supply
Ground
Write Enable
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1997, Texas Instruments Incorporated
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
1