TLV3691_15 Datasheet, PDF (1/23 Pages) Texas Instruments – 0.9-V to 6.5-V, Nanopower Comparator

TLV3691
www.ti.com
SBOS694 – DECEMBER 2013
0.9-V to 6.5-V, Nanopower Comparator
Check for Samples: TLV3691
FEATURES
1
• Low Quiescent Current: 75 nA
• Wide Supply:
– +0.9 V to +6.5 V
– ±0.45 V to ±3.25 V
• microPackages: DFN-6 (1 mm × 1 mm), SC70-5
• Input Common-Mode Range Extends 100 mV
Beyond Both Rails
• Response Time: 24 µs
• Low Input Offset Voltage: ±3 mV
• Push-Pull Output
• Industrial Temperature Range:
–40°C to +125°C
APPLICATIONS
• Over- and Undervoltage Detection
• Window Comparators
• Overcurrent Detection
• Zero-Crossing Detection
• System Monitoring:
– Smart Phones
– Tablets
– Industrial Sensors
– Portable Medical
DESCRIPTION
The TLV3691 offers a wide supply range, low
quiescent current, and rail-to-rail inputs. All of these
features come in industry-standard and extremely
small packages, making this device an excellent
choice for low-voltage and low-power applications.
Available as a single channel, the low-power, wide
supply and temperature range makes this device
flexible enough to handle almost any application from
consumer to industrial. The TLV3691 is available in
SC70-5 and 1-mm × 1-mm DFN-6 packages. This
device is specified for operation across the expanded
industrial temperature range of –40°C to +125°C.
RELATED PRODUCTS
FEATURES
40-ns, 40-µA, push-pull comparator
4.5-ns, rail-to-rail, high-speed comparator
Nanopower push-pull output comparator
3.9-µA, SC70-3 voltage reference
DEVICE
TLV3201
TLV3202
TLV3501
TLV3502
TLV3491
TLV3492
TLV3494
REF3312
REF3318
REF3320
REF3325
REF3330
REF3333
Package Footprint Comparison (To Scale)
1.25 mm
1 mm
2 mm
1 mm
DCK (SC70)
DPF (DFN)
Package Height Comparison (To Scale)
1.25 mm
1 mm
0.9 mm
0.37 mm
DCK (SC70)
DPF (DFN)
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated