TLC59211 Datasheet, PDF (1/12 Pages) Texas Instruments – 8-BIT DMOS SINK DRIVER

TLC59211
www.ti.com .................................................................................................................................................................................................. SCLS712 – MARCH 2009
8-BIT DMOS SINK DRIVER
FEATURES
1
• DMOS Process
• High Voltage Output (V_ds = 30 V)
• Output Current on Each Channel
(I_ds Max = 200 mA)
• Latch-Up Performance Exceeds 250 mA Per
JEDEC Standard JESD-17
• ESD Protection Exceeds JESD 22
– 2000-V Human Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged Device Model (C101)
• LED Driver Application
• Output Clamp Diode (Parasitic)
N OR PW PACKAGE
(TOP VIEW)
N.C. 1
D1 2
D2 3
D3 4
D4 5
D5 6
D6 7
D7 8
D8 9
N.C. 10
20 ^V_CC
19 Y1
18 Y2
17 Y3
16 Y4
15 Y5
14 Y6
13 Y7
12 Y8
11 GND
N.C. – Not internally connected
APPLICATIONS
• Lamp and Display (LED)
• Hammer
• Relay
DESCRIPTION
The TLC59211 is an 8-bit LED and solenoid driver designed for 5-V V_CC operation.
The TLC59211 is characterized for operation from –40°C to 85°C.
T_A
–40°C to 85°C
PDIP – N
TSSOP – PW
ORDERING INFORMATION⁽¹⁾
PACKAGE ⁽²⁾
ORDERABLE PART NUMBER
Reel of 1000
TLC59211IN
Reel of 2000
TLC59211IPWR
TOP-SIDE MARKING
Y59211
Y59211
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
FUNCTION TABLE
(EACH LATCH)⁽¹⁾
INPUTS
D
L
H
OUTPUT
Y
H*
L
(1) L: Low-level
H: High-level
H*: with pullup resistor
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated