TL780 Datasheet, PDF (1/8 Pages) Texas Instruments – POSITIVE-VOLTAGE REGULATORS

TL780 SERIES
POSITIVE-VOLTAGE REGULATORS
D ±1% Output Tolerance at 25°C
D ±2% Output Tolerance Over Full Operating
Range
D Thermal Shutdown
SLVS055F – APRIL 1981 – REVISED DECEMBER 1999
D Internal Short-Circuit Current Limiting
D Pinout Identical to µA7800 Series
D Improved Version of µA7800 Series
description
Each fixed-voltage precision regulator in the TL780 series is capable of supplying 1.5 A of load current. A unique
temperature-compensation technique, coupled with an internally trimmed band-gap reference, has resulted in
improved accuracy when compared to other three-terminal regulators. Advanced layout techniques provide
excellent line, load, and thermal regulation. The internal current-limiting and thermal-shutdown features make
the devices essentially immune to overload.
The TL780-xxC series regulators are characterized for operation over the virtual junction temperature range
of 0°C to 125°C.
KC PACKAGE
(TOP VIEW)
OUTPUT
COMMON
INPUT
The COMMON terminal is in electrical
contact with the mounting base.
TO-220AB
O
C
I
KTE PACKAGE
(TOP VIEW)
OUTPUT
COMMON
INPUT
The COMMON terminal is in electrical
contact with the mounting base.
OC
I
AVAILABLE OPTIONS
PACKAGED DEVICES
TJ
VO TYP
(V)
HEAT-SINK MOUNTED
(KC)
PLASTIC
FLANGE MOUNTED
(KTE)
CHIP
FORM
(Y)
5
TL780-05CKC
TL780-05CKTE
TL780-05Y
0°C to 125°C
12
TL780-12CKC
TL780-12CKTE
TL780-12Y
15
TL780-15CKC
TL780-15CKTE
TL780-15Y
The KTE package is available taped and reeled. Add the suffix R to the device type (e.g.,
TL780-05CKTER). Chip forms are tested at 25°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1999, Texas Instruments Incorporated
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