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TL331_06 Datasheet, PDF (1/6 Pages) Texas Instruments – SINGLE DIFFERENTIAL COMPARATOR
TL331
SINGLE DIFFERENTIAL COMPARATOR
D Single Supply or Dual Supplies
D Wide Range of Supply Voltage
. . . 2 V to 36 V
D Low Supply-Current Drain Independent of
Supply Voltage . . . 0.4 mA Typ
D Low Input Bias Current . . . 25 nA Typ
D Low Input Offset Voltage . . . 2 mV Typ
D Common-Mode Input Voltage Range
Includes Ground
D Differential Input Voltage Range Equal to
Maximum-Rated Supply Voltage . . . ±36 V
D Low Output Saturation Voltage
D Output Compatible With TTL, MOS, and
CMOS
SLVS238E − AUGUST 1999 − REVISED SEPTEMBER 2004
DBV PACKAGE
(TOP VIEW)
IN− 1
VCC−/GND 2
IN+ 3
5 VCC
4 OUT
description/ordering information
This device consists of a single voltage comparator that is designed to operate from a single power supply over
a wide range of voltages. Operation from dual supplies also is possible if the difference between the two supplies
is 2 V to 36 V and VCC is at least 1.5 V more positive than the input common-mode voltage. Current drain is
independent of the supply voltage. The output can be connected to other open-collector outputs to achieve
wired-AND relationships.
ORDERING INFORMATION
TA
VIO(max)
at 25°C
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING‡
−40°C to 85°C
5 mV SOT-23 (DBV)
Reel of 3000
Reel of 250
TL331IDBVR
TL331IDBVT
T1I_
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
‡ DBV: The actual top-side marking has one additional character that designates the assembly/test site.
logic diagram
IN+
OUT
IN−
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2004, Texas Instruments Incorporated
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