TL071CPSE4 Datasheet, PDF (1/49 Pages) Texas Instruments – LOW-NOISE JFET-INPUT OPERATIONAL AMPLIFIERS

TL071, TL071A, TL071B, TL072
TL072A, TL072B, TL074, TL074A, TL074B
LOW-NOISE JFET-INPUT OPERATIONAL AMPLIFIERS
SLOS080J − SEPTEMBER 1978 − REVISED MARCH 2005
D Low Power Consumption
D Wide Common-Mode and Differential
Voltage Ranges
D Low Input Bias and Offset Currents
D Output Short-Circuit Protection
D Low Total Harmonic Distortion
. . . 0.003% Typ
D Low Noise
V_n = 18 nV/√Hz Typ at f = 1 kHz
D High Input Impedance . . . JFET Input Stage
D Internal Frequency Compensation
D Latch-Up-Free Operation
D High Slew Rate . . . 13 V/μs Typ
D Common-Mode Input Voltage Range
Includes V_CC+
description/ordering information
The JFET-input operational amplifiers in the TL07x series are similar to the TL08x series, with low input bias
and offset currents and fast slew rate. The low harmonic distortion and low noise make the TL07x series ideally
suited for high-fidelity and audio preamplifier applications. Each amplifier features JFET inputs (for high input
impedance) coupled with bipolar output stages integrated on a single monolithic chip.
The C-suffix devices are characterized for operation from 0°C to 70°C. The I-suffix devices are characterized
for operation from −40°C to 85°C. The M-suffix devices are characterized for operation over the full military
temperature range of −55°C to 125°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 2005, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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