TB5R3 Datasheet, PDF (1/15 Pages) Texas Instruments – QUAD DIFFERENTIAL PECL RECEIVERS

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TB5R3
SLLS643A – SEPTEMBER 2005 – REVISED OCTOBER 2007
QUAD DIFFERENTIAL PECL RECEIVERS
FEATURES
1
• Functional Replacement for the Agere BRF1A
• Pin Equivalent to General Trade 26LS32
• High Input Impedance Approximately 8 kΩ
• <2.6-ns Maximum Propagation Delay
• TB5R3 Provides 50-mV Hysteresis (Typical)
• -1.1-V to 7.1-V Common-Mode Input Voltage
Range
• Single 5-V ±10% Supply
• ESD Protection HBM > 3 kV and CDM > 2 kV
• Operating Temperature Range: -40°C to 85°C
• Available in Gull-Wing SOIC (JEDEC MS-013,
DW) and SOIC (D) Package
APPLICATIONS
• Digital Data or Clock Transmission Over
Balanced Lines
PIN ASSIGNMENTS
SOIC PACKAGE
(TOP VIEW)
AI
1
AI
2
AO
3
E1
4
BO
5
BI
6
BI
7
GND
8
16
VCC
15
DI
14
DI
13
DO
12
E2
11
CO
10
CI
9
CI
DESCRIPTION
These quad differential receivers accept digital data
over balanced transmission lines. They translate
differential input logic levels to TTL output logic
levels.
The TB5R3 is a pin- and function-compatible
replacement for the Agere systems BRF1A; it
includes 3-kV HBM and 2-kV CDM ESD protection.
The power-down loading characteristics of the
receiver input circuit are approximately 8 kΩ relative
to the power supplies; hence they do not load the
transmission line when the circuit is powered down.
The packaging for this differential line receiver is a
16-pin gull wing SOIC (DW) or a 16 pin SOIC (D).
The enable inputs of this device include internal
pull-up resistors of approximately 40 kΩ that are
connected to V_CC to ensure a logical high level input
if the inputs are open circuited.
FUNCTIONAL BLOCK DIAGRAM
AI
AO
AI
BI
BI
BO
C1
CO
C1
D1
D1
DO
E1
E2
Enable Truth Table
E1
E2
OUTPUT
CONDITION
0
0
Active
1
0
Active
0
1
Disabled
1
1
Active
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated