SN75518FN Datasheet, PDF (1/9 Pages) Texas Instruments – VACUUMFLUORESCENT DISPLAY DRIVERS

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• Each Device Drives 32 Lines
• 60-V Output Voltage Swing Capability
• 25-mA Output Source Current Capability
• High-Speed Serially Shifted Data Input
• Latches on All Driver Outputs
description
The SN65518 and SN75518 are monolithic
BIDFET^† integrated circuits designed to drive a
dot matrix or segmented vacuum fluorescent
display.
Each device consists of a 32-bit shift register, 32
latches, and 32 output AND gates. Serial data is
entered into the shift register on the low-to-high
transition of CLOCK. While LATCH ENABLE is
high, parallel data is transferred to the output
buffers through a 32-bit latch. Data present in the
latch during the high-to-low transition of LATCH
ENABLE is latched. When STROBE is low, all Q
outputs are enabled. When STROBE is high, all Q
outputs are low.
Serial data output from the shift register may be
used to cascade additional devices. This output is
not affected by LATCH ENABLE or STROBE.
The SN65518 is characterized for operation from
−40°C to 85°C. The SN75518 is characterized for
operation from 0°C to 70°C.
SN65518, SN75518
VACUUM FLUORESCENT DISPLAY DRIVERS
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SLDS004B − MARCH 1983 − REVISED MAY 1990
N PACKAGE
(TOP VIEW)
V_{CC2 1}
SERIAL OUT 2
Q32 3
Q31 4
Q30 5
Q29 6
Q28 7
Q27 8
Q26 9
Q25 ¹⁰
Q24 ¹¹
Q23 ¹²
Q22 ¹³
Q21 ¹⁴
Q20 ¹⁵
Q19 ¹⁶
Q18 ¹⁷
Q17 ¹⁸
STROBE ¹⁹
GND ²⁰
40 ^V_CC1
39 DATA IN
38 Q1
37 Q2
36 Q3
35 Q4
34 Q5
33 Q6
32 Q7
31 _Q8
30 _Q9
29 _Q10
28 _Q11
27 _Q12
26 _Q13
25 _Q14
24 _Q15
23 _Q16
22 _{LATCH ENABLE}
21 _CLOCK
FN PACKAGE
(TOP VIEW)
Q29
Q28
Q27
Q26
Q25
Q24
Q23
Q22
Q21
Q20
Q19
6 5 4 3 2 1 44 43 42 41 40
7
39
8
38
9
37
10
36
11
35
12
34
13
33
14
32
15
31
16
30
17
29
18 19 20 21 22 23 24 25 26 27 28
Q4
Q5
Q6
Q7
Q8
Q9
Q10
Q11
Q12
Q13
NC
NC − No internal connection
† BIDFET − Bipolar, double-diffused, N-channel and P-channel MOS transistors on same chip. This is a patented process.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1990, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
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