SN75436 Datasheet, PDF (1/5 Pages) Texas Instruments – QUADRUPLE PERIPHERAL DRIVERS

SN75436, SN75437A
QUADRUPLE PERIPHERAL DRIVERS
• Saturating Outputs With Low On-State
Resistance
• High-Impedance Inputs Compatible With
CMOS and TTL Levels
• Very Low Standby Power . . . 21 mW Max
• High-Voltage Outputs . . . 70 V Min
• No Power-Up or Power-Down Output Glitch
• No Latch-Up Within Recommended
Operating Conditions
• Output-Clamp Diodes for Transient
Suppression
• 2-W Power Package
description
The SN75436 and SN75437A quadruple
peripheral drivers are designed for use in systems
requiring high current, high voltage, and high load
power. Each device features four inverting
open-collector outputs with a common-enable
input that, when taken low, disables all four
outputs. The envelope of 1-V characteristics
exceeds the specifications sufficiently to avoid
high-current latch-up. Applications include driving
relays, lamps, solenoids, motors, LEDs,
transmission lines, hammers, and other high-
power-demand devices.
The SN75436 and SN75437A are offered in a
16-pin wide-body surface-mount (NE) package
and is characterized for operation over the free-air
temperature of 0°C to 70°C.
SLRS019A – DECMEBER 1986 – REVISED OCTOBER 1995
NE PACKAGE
(TOP VIEW)
1Y 1
1, 2 D 2
2Y 3
HEAT SINK
4
AND GND
5
3Y 6
3, 4 D 7
4Y 8
16 1A
15 2A
14 G
13 HEAT SINK
12
AND GND
11 V_CC
10 3A
9 4A
logic symbol^†
14
G
EN
16
1A
15
2A
10
3A
9
4A
CLAMP
1
1Y
3
2Y
2
1, 2 D
6
3Y
8
4Y
7
3, 4 D
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984}
and IEC publication 617-12.
FUNCTION TABLE
(each NAND driver)
INPUTS OUTPUT
AG
Y
HH
L
L
X
H
X
L
H
H = high level, L = low level,
X = irrelevant
SELECTION GUIDE
FEATURE
SN75436
Maximum recommended output current
0.5
Maximum VOL at maximum IOL
0.5
Maximum recommended output supply
voltage in an inductive switching circuit, VS
50
SN75437A
0.5
0.5
35
UNIT
A
V
V
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1995, Texas Instruments Incorporated
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