SN74LVC1G3208 Datasheet, PDF (1/13 Pages) Texas Instruments – SINGLE 3-INPUT POSITIVE OR-AND GATE

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FEATURES
• Available in the Texas Instruments
NanoStar™ and NanoFree™ Packages
• Supports 5-V V_CC Operation
• Inputs Accept Voltages to 5.5 V
• Max t_pd of 5 ns at 3.3 V
• Low Power Consumption, 10-µA Max I_CC
• ±24-mA Output Drive at 3.3 V
• Input Hysteresis Allows Slow Input Transition
and Better Switching Noise Immunity at the
Input
(V_hys = 250 mV Typ @ 3.3 V)
SN74LVC1G3208
SINGLE 3-INPUT POSITIVE OR-AND GATE
SCES605A – SEPTEMBER 2004 – REVISED JUNE 2005
• Can Be Used in Three Combinations:
– OR-AND Gate
– OR Gate
– AND Gate
• I_off Supports Partial-Power-Down Mode
Operation
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
YEP OR YZP PACKAGE
(BOTTOM VIEW)
A
1
GND
2
6
C
A
1
6
C
GND
2
5
V_CC
5
V_CC
B
3
4Y
B ³⁴ Y
GND ^{2 5 V}CC
A ¹⁶ C
B
3
4
Y
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This device is designed for 1.65-V to 5.5-V V_CC operation.
The SN74LVC1G3208 is a single 3-input positive OR-AND gate. It performs the Boolean function Y = (A + B) ⋅ C
in positive logic.
ORDERING INFORMATION
T_A
PACKAGE ⁽¹⁾
NanoStar™ – WCSP (DSBGA)
0.23-mm Large Bump – YEP
NanoFree™ – WCSP (DSBGA)
0.23-mm Large Bump – YZP
(Pb-free)
–40°C to 85°C
SOT (SOT-23) – DBV
Reel of 3000
Reel of 3000
Reel of 250
ORDERABLE PART NUMBER
SN74LVC1G3208YEPR
SN74LVC1G3208YZPR
SN74LVC1G3208DBVR
SN74LVC1G3208DBVT
SOT (SC-70) – DCK
Reel of 3000
Reel of 250
SN74LVC1G3208DCKR
SN74LVC1G3208DCKT
TOP-SIDE MARKING⁽²⁾
_ _ _ DD _
CDD_
DD_
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) DBV/DCK: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, ⋅ = Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2005, Texas Instruments Incorporated