English
Language : 

SN74LVC1G17-Q1 Datasheet, PDF (1/9 Pages) Texas Instruments – SINGLE SCHMITT-TRIGGER BUFFER
www.ti.com
SN74LVC1G17-Q1
SINGLE SCHMITT-TRIGGER BUFFER
SCES663 – MARCH 2006
FEATURES
• Qualified for Automotive Applications
• Customer-Specific Configuration Control Can
Be Supported Along With Major-Change
Approval
• Supports 5-V VCC Operation
DBV PACKAGE
(TOP VIEW)
• Inputs Accept Voltages to 5.5 V
• ±24-mA Output Drive at 3.3 V
• Ioff Supports Partial-Power-Down Mode
Operation
DCK PACKAGE
(TOP VIEW)
NC
1
A
2
5
VCC
NC
1
5
VCC
A
2
GND
3
4Y
GND
3
4
Y
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G17-Q1 contains one buffer and performs the Boolean function Y = A. The device functions as
an independent buffer, but because of Schmitt action, it may have different input threshold levels for
positive-going (VT+) and negative-going (VT–) signals.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
TA
–40°C to 125°C
ORDERING INFORMATION
PACKAGE (1)
ORDERABLE PART NUMBER
SOT (SOT-23) – DBV Reel of 3000
SN74LVC1G17QDBVRQ1
SOT (SC-70) – DCK
Reel of 3000
SN74LVC1G17QDCKRQ1
TOP-SIDE MARKING(2)
C17_
C7_
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) DBV/DCK: The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUT A
H
L
OUTPUT Y
H
L
LOGIC DIAGRAM (POSITIVE LOGIC)
A2
4Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated