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SN74LVC125A Datasheet, PDF (1/8 Pages) Texas Instruments – QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS
D EPIC™ (Enhanced-Performance Implanted
CMOS) Submicron Process
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D Typical VOLP (Output Ground Bounce)
< 0.8 V at VCC = 3.3 V, TA = 25°C
D Typical VOHV (Output VOH Undershoot)
> 2 V at VCC = 3.3 V, TA = 25°C
D Inputs Accept Voltages to 5.5 V
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), and Thin Shrink Small-Outline (PW)
Packages
SN74LVC125A
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCAS290F – JANUARY 1993 – REVISED JUNE 1998
D, DB, OR PW PACKAGE
(TOP VIEW)
1OE 1
1A 2
1Y 3
2OE 4
2A 5
2Y 6
GND 7
14 VCC
13 4OE
12 4A
11 4Y
10 3OE
9 3A
8 3Y
description
This quadruple bus buffer gate is designed for 1.65-V to 3.6-V VCC operation.
The SN74LVC125A features independent line drivers with 3-state outputs. Each output is disabled when the
associated output-enable (OE) input is high.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
The SN74LVC125A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each buffer)
INPUTS
OE
A
OUTPUT
Y
L
H
H
L
L
L
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1998, Texas Instruments Incorporated
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