SN74GTL3004 Datasheet, PDF (1/10 Pages) Texas Instruments – SELECTABLE GTL VOLTAGE REFERENCE

SN74GTL3004
www.ti.com .................................................................................................................................................. SCBS873A – FEBRUARY 2008 – REVISED APRIL 2008
SELECTABLE GTL VOLTAGE REFERENCE
FEATURES
1
• V_DD Range: 3.0 V to 3.6 V
• V_TT Range: 1 V to 1.3 V
• Provides Selectable GTL V_REF
– 0.615 × V_TT
– 0.63 × V_TT
– 0.65 × V_TT
– 0.67 × V_TT
• ±1% Resistor Ratio Tolerance
• Ambient Temperature Range: –40°C to 85°C
• ESD Protection Exceeds the Following Levels
Tests (Tested Per JESD-22):
– 2500-V Human-Body Model
(A114-B, Class II)
– 250-V Machine Model (A115-A)
– 1500-V Charged-Device Model (C101)
DCK PACKAGE
(TOP VIEW)
V_DD
1
6
V_TT
GND
2
5
GTL_REF
S0
3
4
S1
DESCRIPTION/ORDERING INFORMATION
The SN74GTL3004 provides for a selectable GTL Voltage Reference (GTL V_REF). The value of the GTL V_REF can
be adjusted using S0 and S1 select pins.
The S0 and S1 pins contain glitch-suppression circuitry for excellent noise immunity. When left floating, the S0
and S1 control input pins have 100-kΩ pullups that set the GTL V_REF default value to the 0.67 × V_TT ratio
(S0 = 1 and S1 =1).
T_A
–40°C to 85°C
ORDERING INFORMATION
PACKAGE ^{(1) (2)}
ORDERABLE PART NUMBER
SOT (SC70) – DCK
Tape and reel
SN74GTL3004DCKR
TOP-SIDE MARKING
2TK
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated