SN74CBTLV1G125_07 Datasheet, PDF (1/10 Pages) Texas Instruments – LOW-VOLTAGE SINGLE FET BUS SWITCH

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SN74CBTLV1G125
LOW-VOLTAGE SINGLE FET BUS SWITCH
SCDS057H – MARCH 1998 – REVISED JUNE 2006
FEATURES
• 5-Ω Switch Connection Between Two Ports
• Rail-to-Rail Switching on Data I/O Ports
• I_off Supports Partial-Power-Down Mode
Operation
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
OE
1
A
2
OE
1
5
V_CC
5
V_CC
A
2
GND
3
4B
GND
3
4
B
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
The SN74CBTLV1G125 features a single high-speed line switch. The switch is disabled when the output-enable
(OE) input is high.
This device is fully specified for partial-power-down applications using I_off. The I_off feature ensures that damaging
current will not backflow through the device when it is powered down. The device has isolation during power off.
To ensure the high-impedance state during power up or power down, OE should be tied to V_CC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
T_A
–40°C to 85°C
ORDERING INFORMATION
PACKAGE ⁽¹⁾
ORDERABLE PART NUMBER
SOT (SOT-23) – DBV Reel of 3000 SN74CBTLV1G125DBVR
SOT (SC-70) – DCK Reel of 3000 SN74CBTLV1G125DCKR
TOP-SIDE MARKING⁽²⁾
V25_
VM_
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUT
OE
L
H
FUNCTION
A port = B port
Disconnect
LOGIC DIAGRAM (POSITIVE LOGIC)
2
A
4
SW
B
1
OE
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1998–2006, Texas Instruments Incorporated