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SN74CBTD16211 Datasheet, PDF (1/6 Pages) Texas Instruments – 24-BIT FET BUS SWITCH WITH LEVEL SHIFTING
D 5-Ω Switch Connection Between Two Ports
D TTL-Compatible Input Levels
D Designed to Be Used in Level-Shifting
Applications
D Package Options Include Plastic 300-mil
Shrink Small-Outline (DL), Thin Shrink
Small-Outline (DGG), and Thin Very
Small-Outline (DGV) Packages
description
The SN74CBTD16211 provides 24 bits of
high-speed TTL-compatible bus switching. The
low on-state resistance of the switch allows
connections to be made with minimal propagation
delay. A diode to VCC is integrated in the circuit to
allow for level shifting between 5-V inputs and
3.3-V outputs.
The device is organized as a dual 12-bit bus
switch with separate output-enable (OE) inputs. It
can be used as two 12-bit bus switches or as one
24-bit bus switch. When OE is low, the associated
12-bit bus switch is on and A port is connected to
B port. When OE is high, the switch is open, and
a high-impedance state exists between the ports.
The SN74CBTD16211 is characterized for
operation from –40°C to 85°C.
FUNCTION TABLE
(each 12-bit bus switch)
INPUT
OE
FUNCTION
L A port = B port
H
Disconnect
SN74CBTD16211
24-BIT FET BUS SWITCH
WITH LEVEL SHIFTING
SCDS048C – MARCH 1998 – REVISED MAY 1998
DGG, DGV, OR DL PACKAGE
(TOP VIEW)
NC 1
1A1 2
1A2 3
1A3 4
1A4 5
1A5 6
1A6 7
GND 8
1A7 9
1A8 10
1A9 11
1A10 12
1A11 13
1A12 14
2A1 15
2A2 16
VCC 17
2A3 18
GND 19
2A4 20
2A5 21
2A6 22
2A7 23
2A8 24
2A9 25
2A10 26
2A11 27
2A12 28
56 1OE
55 2OE
54 1B1
53 1B2
52 1B3
51 1B4
50 1B5
49 GND
48 1B6
47 1B7
46 1B8
45 1B9
44 1B10
43 1B11
42 1B12
41 2B1
40 2B2
39 2B3
38 GND
37 2B4
36 2B5
35 2B6
34 2B7
33 2B8
32 2B9
31 2B10
30 2B11
29 2B12
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1998, Texas Instruments Incorporated
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