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SN74BCT25642 Datasheet, PDF (1/10 Pages) Texas Instruments – 25-Ω OCTAL BUS TRANSCEIVER
• State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
• ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds
200 V Using Machine Model (C = 200 pF,
R = 0)
• Designed to Facilitate Incident-Wave
Switching for Line Impedances of 25 Ω
or Greater
• Distributed VCC and GND Pins Minimize
Noise Generated by the Simultaneous
Switching of Outputs
• The A Port Features Open-Collector
Outputs That Provide 188-mA IOL to Allow
for Heavy DC Loading on Open-Collector
Outputs
• Eliminates Need for 3-State Overlap
Protection on A Ports
• Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic 300-mil DIPs (NT)
SN74BCT25642
25ĆΩ OCTAL BUS TRANSCEIVER
ą
SCBS047C − DECEMBER 1989 − REVISED NOVEMBER 1993
DW OR NT PACKAGE
(TOP VIEW)
A1 1
GND 2
A2 3
A3 4
GND 5
A4 6
A5 7
GND 8
A6 9
A7 10
GND 11
A8 12
24 DIR
23 B1
22 B2
21 VCC
20 B3
19 B4
18 B5
17 B6
16 VCC
15 B7
14 B8
13 OE
description
This 25-Ω octal bus transceiver is designed for asynchronous communication between data buses. The device
transmits data from the A bus to the B bus or from the B bus to the A bus depending upon the level at the
direction-control (DIR) input. The output-enable (OE) input can be used to disable the device so the buses are
effectively isolated.
The SN74BCT25642 is capable of sinking 188-mA IOL (A port), which facilitates switching 25-Ω transmission
lines on the incident wave. It is designed specifically to improve both the performance and density of 3-state
memory address drivers, clock drivers, and bus-oriented transceivers. The distributed VCC and GND pins
minimize the noise generated by the simultaneous switching of the outputs.
The SN74BCT25642 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
OE DIR
OPERATION
L
L
B data to A bus
L
H A data to B bus
H
X
Isolation
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1993, Texas Instruments Incorporated
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