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SN74AUC2G125 Datasheet, PDF (1/12 Pages) Texas Instruments – DUAL BUS BUFFER GATE WITH 3-STATE OUTPUTS
www.ti.com
FEATURES
• Available in the Texas Instruments
NanoStar™ and NanoFree™ Packages
• Optimized for 1.8-V Operation and Is 3.6-V I/O
Tolerant to Support Mixed-Mode Signal
Operation
• Ioff Supports Partial-Power-Down Mode
Operation
• Sub-1-V Operable
• Max tpd of 1.8 ns at 1.8 V
• Low Power Consumption, 10 µA at 1.8 V
• ±8-mA Output Drive at 1.8 V
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
SN74AUC2G125
DUAL BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCES532A – DECEMBER 2003 – REVISED MARCH 2005
DCT OR DCU PACKAGE
(TOP VIEW)
1OE 1
1A 2
2Y 3
GND 4
8 VCC
7 2OE
6 1Y
5 2A
YEP OR YZP PACKAGE
(BOTTOM VIEW)
GND 4 5 2A
2Y 3 6 1Y
1A 2 7 2OE
1OE 1 8 VCC
DESCRIPTION/ORDERING INFORMATION
This dual bus buffer gate is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V
VCC operation.
The SN74AUC2G125 features dual line drivers with 3-state outputs. The outputs are disabled when the
associated output-enable (OE) input is high.
NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
For more information about AUC Little Logic devices, please refer to the TI application report, Applications of
Texas Instruments AUC Sub-1-V Little Logic Devices, literature number SCEA027.
TA
–40°C to 85°C
ORDERING INFORMATION
PACKAGE (1)
ORDERABLE PART NUMBER
NanoStar™ – WCSP (DSBGA)
0.23-mm Large Bump – YEP
Tape and reel SN74AUC2G125YEPR
NanoFree™ – WCSP (DSBGA)
0.23-mm Large Bump – YZP (Pb-free)
Tape and reel
SN74AUC2G125YZPR
SSOP – DCT
Tape and reel SN74AUC2G125DCTR
VSSOP – DCU
Tape and reel SN74AUC2G125DCUR
TOP-SIDE MARKING(2)
_ _ _UM_
U25_ _ _
UM_
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, ⋅ = Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2005, Texas Instruments Incorporated