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SN74AUC1G32 Datasheet, PDF (1/13 Pages) Texas Instruments – SINGLE 2-INPUT POSITIVE-OR GATE
SN74AUC1G32
SINGLE 2ĆINPUT POSITIVEĆOR GATE
D Available in the Texas Instruments
NanoStar and NanoFree Packages
D Optimized for 1.8-V Operation and Is 3.6-V
I/O Tolerant to Support Mixed-Mode Signal
Operation
D Ioff Supports Partial-Power-Down Mode
Operation
D Sub 1-V Operable
D Max tpd of 2.4 ns at 1.8 V
D Low Power Consumption, 10-µA Max ICC
D ±8-mA Output Drive at 1.8 V
D Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D ESD Protection Exceeds JESD 22
− 2000-V Human-Body Model (A114-A)
− 200-V Machine Model (A115-A)
− 1000-V Charged-Device Model (C101)
SCES377I − SEPTEMBER 2001 − REVISED NOVEMBER 2003
DBV OR DCK PACKAGE
(TOP VIEW)
A1
B2
GND 3
5 VCC
4Y
YEA, YEP, YZA, OR YZP PACKAGE
(BOTTOM VIEW)
GND 3 4 Y
B2
A 1 5 VCC
description/ordering information
This single 2-input positive-OR gate is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V
to 1.95-V VCC operation.
The SN74AUC1G32 performs the Boolean function Y + A ) B or Y + A • B in positive logic.
NanoStar and NanoFree package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING‡
NanoStar − WCSP (DSBGA)
0.17-mm Small Bump − YEA
SN74AUC1G32YEAR
−40°C to 85°C
NanoFree − WCSP (DSBGA)
0.17-mm Small Bump − YZA (Pb-free)
NanoStar − WCSP (DSBGA)
0.23-mm Large Bump − YEP
Tape and reel
SN74AUC1G32YZAR
SN74AUC1G32YEPR
_ _ _UG_
NanoFree − WCSP (DSBGA)
0.23-mm Large Bump − YZP (Pb-free)
SN74AUC1G32YZPR
SOT (SOT-23) − DBV
Tape and reel SN74AUC1G32DBVR U32_
SOT (SC-70) − DCK
Tape and reel SN74AUC1G32DCKR UG_
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
‡ DBV/DCK: The actual top-side marking has one additional character that designates the assembly/test site.
YEA/YZA, YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code,
and one following character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition
(1 = SnPb, • = Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar and NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2003, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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