SN74ALVCH245 Datasheet, PDF (1/8 Pages) Texas Instruments – OCTAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS

D EPIC™ (Enhanced-Performance Implanted
CMOS) Submicron Process
D Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D Package Options Include Plastic
Small-Outline (DW), Thin Very
Small-Outline (DGV), and Thin Shrink
Small-Outline (PW) Packages
description
SN74ALVCH245
OCTAL BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCES119D – JULY 1997 – REVISED MAY 1999
DGV, DW, OR PW PACKAGE
(TOP VIEW)
DIR 1
A1 2
A2 3
A3 4
A4 5
A5 6
A6 7
A7 8
A8 9
GND ¹⁰
20 V_CC
19 OE
18 B1
17 B2
16 B3
15 B4
14 B5
13 B6
12 B7
11 _B8
This octal bus transceiver is designed for 1.65-V to 3.6-V V_CC operation.
The SN74ALVCH245 is designed for asynchronous communication between data buses. The device transmits
data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the
direction-control (DIR) input. The output-enable (OE) input can be used to disable the device so the buses are
effectively isolated.
To ensure the high-impedance state during power up or power down, OE should be tied to V_CC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN74ALVCH245 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OE DIR
OPERATION
L
L
B data to A bus
L
H A data to B bus
H
X
Isolation
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1999, Texas Instruments Incorporated
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