SN74ALVCH244 Datasheet, PDF (1/9 Pages) Texas Instruments – OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

D EPIC™ (Enhanced-Performance Implanted
CMOS) Submicron Process
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D Package Options Include Plastic
Small-Outline (DW, NS), Thin Very
Small-Outline (DGV), and Thin Shrink
Small-Outline (PW) Packages
SN74ALVCH244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES112C – JULY 1997 – REVISED FEBRUARY 1999
DGV, DW, NS, OR PW PACKAGE
(TOP VIEW)
1OE 1
1A1 2
2Y4 3
1A2 4
2Y3 5
1A3 6
2Y2 7
1A4 8
2Y1 9
GND 10
20 V_CC
19 2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y4
11 2A1
description
This octal buffer/line driver is designed for 1.65-V to 3.6-V V_CC operation.
The SN74ALVCH244 is organized as two 4-bit line drivers with separate output-enable (OE) inputs. When OE
is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the
high-impedance state.
To ensure the high-impedance state during power up or power down, OE should be tied to V_CC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN74ALVCH244 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each buffer)
INPUTS
OE
A
OUTPUT
Y
L
H
H
L
L
L
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1999, Texas Instruments Incorporated
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