SN74ALS280_07 Datasheet, PDF (1/14 Pages) Texas Instruments – 9-BIT PARITY GENERATORS/CHECKETS

• Generate Either Odd or Even Parity for Nine
Data Lines
• Cascadable for n-Bit Parity
• Can Be Used to Upgrade Existing Systems
Using MSI Parity Circuits
• Package Options Include Plastic
Small-Outline (D) Packages and Standard
Plastic (N) 300-mil DIPs
description
SN74ALS280, SN74AS280
9ĆBIT PARITY GENERATORS/CHECKERS
ą
SDAS038C − DECEMBER 1982 − REVISED DECEMBER 1994
D OR N PACKAGE
(TOP VIEW)
G1
H2
NC 3
I4
Σ EVEN 5
Σ ODD 6
GND 7
14 V_CC
13 F
12 E
11 D
10 C
9B
8A
These universal 9-bit parity generators/checkers
NC − No internal connection
utilize advanced Schottky high-performance
circuitry and feature odd (Σ ODD) and even (Σ EVEN) outputs to facilitate operation of either odd- or even-parity
applications. The word-length capability is easily expanded by cascading.
These devices can be used to upgrade the performance of most systems utilizing the SN74ALS180 and
SN74AS180 parity generators/checkers. Although the SN74ALS280 and SN74AS280 are implemented without
expander inputs, the corresponding function is provided by the availability of an input (I) at terminal 4 and the
absence of any internal connection at terminal 3. This permits the SN74ALS280 and SN74AS280 to be
substituted for the SN74ALS180 and SN74AS180 in existing designs to produce an identical function even if
the devices are mixed with existing SN74ALS180 and SN74AS180 devices.
All SN74AS280 inputs are buffered to lower the drive requirements.
The SN74ALS280 and SN74AS280 are characterized for operation from 0°C to 70°C.
FUNCTION TABLE
NO. OF INPUTS
A−I
THAT ARE HIGH
0, 2, 4, 6, 8
OUTPUTS
Σ EVEN
H
Σ ODD
L
1, 3, 5, 7, 9
L
H
logic symbol^†
8
2k
A
9
B
10
C
11
D
12
E
13
F
1
G
2
H
4
I
5
Σ EVEN
6
Σ ODD
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.}
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1994, Texas Instruments Incorporated
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