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SN74AHC1G08-Q1 Datasheet, PDF (1/8 Pages) Texas Instruments – SINGLE 2-INPUT POSITIVE-AND GATE
SN74AHC1G08ĆQ1
SINGLE 2ĆINPUT POSITIVEĆAND GATE
D Qualification in Accordance With
AEC-Q100†
D Qualified for Automotive Applications
D Customer-Specific Configuration Control
Can Be Supported Along With
Major-Change Approval
D Operating Range of 2 V to 5.5 V
D Max tpd of 9 ns at 5 V
D Low Power Consumption, 20-µA Max ICC
D ±8-mA Output Drive at 5 V
D Schmitt Trigger Action at All Inputs Makes
the Circuit Tolerant for Slower Input Rise
and Fall Time
D ESD Protection Level Per AEC-Q100
Classification
− 2000-V (H2) Human-Body Model
− 200-V (M3) Machine Model
− 1000-V (C5) Charged-Device Model
† Contact factory for details. Q100 qualification data available on
request.
SCLS592B − OCTOBER 2004 – REVISED MARCH 2005
DBV OR DCK PACKAGE
(TOP VIEW)
A1
B2
GND 3
5 VCC
4Y
description/ordering information
The SN74AHC1G08 is a single 2-input positive-AND gate. The device performs the Boolean function
Y + A • B or Y + A ) B in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING§
−40°C to 85°C
SOT (SOT-23) − DBV
SOT (SC-70) − DCK
Reel of 3000
Reel of 3000
SN74AHC1G08IDBVRQ1
SN74AHC1G08IDCKRQ1
A08_
AE_
SOT (SOT-23) − DBV
−40°C to 125°C
SOT (SC-70) − DCK
Reel of 3000
Reel of 3000
SN74AHC1G08QDBVRQ1 A08_
SN74AHC1G08QDCKRQ1 AE_
‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
§ The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUTS
A
B
OUTPUT
Y
H
H
H
L
X
L
X
L
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2005, Texas Instruments Incorporated
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