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SN65LVEP11_10 Datasheet, PDF (1/12 Pages) Texas Instruments – 2.5 V/3.3 V PECL/ECL 1:2 Fanout Buffer
SN65LVEP11
www.ti.com ........................................................................................................................................ SLLS930A – NOVEMBER 2008 – REVISED DECEMBER 2008
2.5 V/3.3 V PECL/ECL 1:2 Fanout Buffer
FEATURES
1
• 1:2 PECL/ECL Fanout Buffer
• Operating Range
PINOUT ASSIGNMENT
– PECL: VCC = 2.375 V to 3.8V With VEE = 0 V
– NECL: VCC = 0 V With VEE = –2.375V to
–3.8 V
Q0 1
+
8 VCC
• Open Input Default State
• Support for Clock Frequencies > 3.0 GHz
• 240 ps Typical Propagation Delay
• Deterministic Output Value for Open Input
Conditions
Q0 2
Q1 3
7D
+
6D
• Q Output Will Default Low When Input Open or
at VEE
• Built-in Temperature Compensation
• Drop in Compatible to MC10LVEP11,
MC100LVEP11
PIN
Q1 4
5 VEE
Table 1. PIN DESCRIPTION
FUNCTION
• LVDS Input Compatible
D, D
PECL/ECL data inputs
DESCRIPTION
Q0, Q0, Q1, Q1
VCC
PECL/ECL outputs
Positive supply
The SN65LVEP11 is a differential 1:2 PECL/ECL
VEE
fanout buffer. The device includes circuitry to
maintain known logic levels when the inputs are in an
open condition. Single-ended clock input operation is
limited to VCC ≥ 3 V in PECL mode, or VEE ≤ 3 V in
NECL mode. The device is housed in an
industry-standard SOIC-8 package and is also
available in TSSOP-8 package option.
ORDERING INFORMATION(1)
Negative supply
PART NUMBER
SN65LVEP11D
SN65LVEP11DGK
PART MARKING
SN65LVEP11
SN65LVEP11
PACKAGE
SOIC
SOIC-TSSOP
LEAD FINISH
NiPdAu
NiPdAu
(1) Leaded device option not initially available; contact TI sales representative for further information.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated