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SN65HVD230_06 Datasheet, PDF (1/32 Pages) Texas Instruments – 3.3-V CAN TRANSCEIVERS
www.ti.com
3.3-V CAN TRANSCEIVERS
SN65HVD230
SN65HVD231
SN65HVD232
SLOS346H – MARCH 2001 – REVISED JULY 2006
FEATURES
• Operates With a 3.3-V Supply
• Low Power Replacement for the PCA82C250
Footprint
• Bus/Pin ESD Protection Exceeds 16 kV HBM
• High Input Impedance Allows for 120 Nodes
on a Bus
• Controlled Driver Output Transition Times for
Improved Signal Quality on the SN65HVD230
and SN65HVD231
• Unpowered Node Does Not Disturb the Bus
• Compatible With the Requirements of the ISO
11898 Standard
• Low-Current SN65HVD230 Standby Mode
370 µA Typical
• Low-Current SN65HVD231 Sleep Mode 40 nA
Typical
• Designed for Signaling Rates(1) up to 1
Megabit/Second (Mbps)
• Thermal Shutdown Protection
• Open-Circuit Fail-Safe Design
• Glitch-Free Power-Up and Power-Down
Protection for Hot-Plugging Applications
(1) The signaling rate of a line is the number of voltage
transitions that are made per second expressed in the units
bps (bits per second).
APPLICATIONS
• Motor Control
• Industrial Automation
• Basestation Control and Status
• Robotics
• Automotive
• UPS Control
SN65HVD230D (Marked as VP230)
SN65HVD231D (Marked as VP231)
(TOP VIEW)
D
1
8
RS
GND
2
7
CANH
VCC
3
6
CANL
R
4
5
Vref
SN65HVD232D (Marked as VP232)
(TOP VIEW)
D
1
8
NC
GND
2
7
CANH
VCC
3
6
CANL
R
4
5
NC
NC – No internal connection
LOGIC DIAGRAM (POSITIVE LOGIC)
SN65HVD230, SN65HVD231
Logic Diagram (Positive Logic)
3
VCC
5 Vref
D1
RS 8
R4
7 CANH
6 CANL
SN65HVD232
Logic Diagram (Positive Logic)
D1
R4
7 CANH
6 CANL
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
TMS320Lx240x is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2001–2006, Texas Instruments Incorporated