SN65HVD230Q-Q1_07 Datasheet, PDF (1/30 Pages) Texas Instruments – 3.3-V CAN TRANSCEIVERS

SN65HVD230Q-Q1
SN65HVD231Q-Q1
SN65HVD232Q-Q1
SGLS117C – JUNE 2001 – REVISED JUNE 2002
3.3-V CAN TRANSCEIVERS
FEATURES
D Qualification in Accordance With AEC-Q100^†
D Qualified for Automotive Applications
D Customer-Specific Configuration Control Can
Be Supported Along With Major-Change
Approval
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D Operates With a 3.3-V Supply
D Low Power Replacement for the PCA82C250
Footprint
D Bus/Pin ESD Protection Exceeds 15-kV HBM
D Controlled Driver Output Transition Times for
Improved Signal Quality on the SN65HVD230Q
and SN65HVD231Q
D Unpowered Node Does Not Disturb the Bus
D Compatible With the Requirements of the
ISO 11898 Standard
D Low-Current SN65HVD230Q Standby Mode
370 µA Typical
† _{Contact factory for details. Q100 qualification data available on}
request.
logic diagram (positive logic)
SN65HVD230Q, SN65HVD231Q
Logic Diagram (Positive Logic)
3
VCC
5 _Vref
D1
RS ⁸
R4
7 _CANH
6 _CANL
D Low-Current SN65HVD231Q Sleep Mode
0.1 µA Typical
D Designed for Signaling Rates^‡ Up To
1 Megabit/Second (Mbps)
D Thermal Shutdown Protection
D Open-Circuit Fail-Safe Design
D
GND
V_CC
R
SN65HVD230QD
SN65HVD231QD
(TOP VIEW)
1
8
R_S
2
7
CANH
3
6
CANL
4
5
V_ref
SN65HVD232QD
(TOP VIEW)
D1
GND 2
V_CC 3
R4
8 NC
7 CANH
6 CANL
5 NC
NC – No internal connection
SN65HVD232Q
Logic Diagram (Positive Logic)
D1
R4
7 _CANH
6 _CANL
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
‡ _{The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).}
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
www.ti.com
Copyright  2002, Texas Instruments Incorporated
1