SN65HVD230 Datasheet, PDF (1/29 Pages) Texas Instruments – 3.3-V CAN TRANSCEIVERS

SN65HVD230
SN65HVD231
SN65HVD232
SLOS346G – MARCH 2001 – REVISED JUNE 2002
3.3-V CAN TRANSCEIVERS
FEATURES
D Operates With a 3.3-V Supply
D Low Power Replacement for the PCA82C250
Footprint
D Bus/Pin ESD Protection Exceeds 16 kV HBM
D High Input Impedance Allows for 120 Nodes
on a Bus
D Controlled Driver Output Transition Times for
Improved Signal Quality on the SN65HVD230
and SN65HVD231
D Unpowered Node Does Not Disturb the Bus
D Compatible With the Requirements of the
ISO 11898 Standard
D Low-Current SN65HVD230 Standby Mode
370 µA Typical
D Low-Current SN65HVD231 Sleep Mode
40 nA Typical
D Designed for Signaling Rates^† up to
1 Megabit/Second (Mbps)
D Thermal Shutdown Protection
D Open-Circuit Fail-Safe Design
D Glitch-Free Power-Up and Power-Down
Protection for Hot-Plugging Applications
LOGIC DIAGRAM (POSITIVE LOGIC)
APPLICATIONS
D Motor Control
D Industrial Automation
D Basestation Control and Status
D Robotics
D Automotive
D UPS Control
SN65HVD230D (Marked as VP230)
SN65HVD231D (Marked as VP231)
(TOP VIEW)
D
1
8
R_S
GND
2
7
CANH
V_CC
3
6
CANL
R
4
5
V_ref
SN65HVD232D (Marked as VP232)
(TOP VIEW)
D
1
8
NC
GND
2
7
CANH
V_CC
3
6
CANL
R
4
5
NC
NC – No internal connection
SN65HVD230, SN65HVD231
Logic Diagram (Positive Logic)
3
VCC
5 _Vref
D1
RS ⁸
R4
7 _CANH
6 _CANL
SN65HVD232
Logic Diagram (Positive Logic)
D1
R4
7 _CANH
6 _CANL
† _{The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).}
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
TMS320Lx240x is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2002, Texas Instruments Incorporated
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