SN54LVTH18514 Datasheet, PDF (1/34 Pages) Texas Instruments – 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670C – AUGUST 1996 – REVISED MARCH 1998
D Members of the Texas Instruments (TI™)
SCOPE ™ Family of Testability Products
D Members of the TI Widebus ™ Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
D Support Unregulated Battery Operation
Down to 2.7 V
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D B-Port Outputs of ’LVTH182514 Devices
Have Equivalent 25-Ω Series Resistors, So
No External Resistors Are Required
D Compatible With the IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
D Package Options Include 64-Pin Plastic
Thin Shrink Small-Outline (DGG) and 64-Pin
Ceramic Dual Flat (HKC) Packages Using
0.5-mm Center-to-Center Spacings
SN54LVTH18514, SN54LVTH182514 . . . HKC PACKAGE
SN74LVTH18514, SN74LVTH182514 . . . DGG PACKAGE
(TOP VIEW)
LEBA 1
OEBA 2
A1 3
A2 4
A3 5
GND 6
A4 7
A5 8
A6 9
V_CC 10
A7 11
A8 12
A9 13
GND 14
A10 15
A11 16
A12 17
A13 18
GND 19
A14 20
A15 21
A16 22
V_CC 23
A17 24
A18 25
A19 26
GND 27
A20 28
CLKENAB 29
CLKAB 30
TDO 31
TMS 32
64 CLKBA
63 CLKENBA
62 B1
61 B2
60 B3
59 GND
58 B4
57 B5
56 B6
55 V_CC
54 B7
53 B8
52 B9
51 GND
50 B10
49 B11
48 B12
47 B13
46 GND
45 B14
44 B15
43 B16
42 V_CC
41 B17
40 B18
39 B19
38 GND
37 B20
36 OEAB
35 LEAB
34 TDI
33 TCK
description
The ’LVTH18514 and ’LVTH182514 scan test devices with 20-bit universal bus transceivers are members of
the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990
boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) V_CC operation, but with the
capability to provide a TTL interface to a 5-V system environment.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, UBT, and TI are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright © 1998, Texas Instruments Incorporated
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