SN54LVTH18512_07 Datasheet, PDF (1/38 Pages) Texas Instruments – 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Members of the Texas Instruments
Widebus ™ Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
D Support Unregulated Battery Operation
Down to 2.7 V
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D B-Port Outputs of ’LVTH182512 Devices
Have Equivalent 25-Ω Series Resistors, So
No External Resistors Are Required
D Compatible With the IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
D Package Options Include 64-Pin Plastic
Thin Shrink Small Outline (DGG) and 64-Pin
Ceramic Dual Flat (HKC) Packages Using
0.5-mm Center-to-Center Spacings
SN54LVTH18512, SN54LVTH182512 . . . HKC PACKAGE
SN74LVTH18512, SN74LVTH182512 . . . DGG PACKAGE
(TOP VIEW)
1CLKAB 1
1LEAB 2
1OEAB 3
1A1 4
1A2 5
GND 6
1A3 7
1A4 8
1A5 9
V_CC 10
1A6 11
1A7 12
1A8 13
GND 14
1A9 15
2A1 16
2A2 17
2A3 18
GND 19
2A4 20
2A5 21
2A6 22
V_CC 23
2A7 24
2A8 25
2A9 26
GND 27
2OEAB 28
2LEAB 29
2CLKAB 30
TDO 31
TMS 32
64 1CLKBA
63 1LEBA
62 1OEBA
61 1B1
60 1B2
59 GND
58 1B3
57 1B4
56 1B5
55 V_CC
54 1B6
53 1B7
52 1B8
51 GND
50 1B9
49 2B1
48 2B2
47 2B3
46 GND
45 2B4
44 2B5
43 2B6
42 V_CC
41 2B7
40 2B8
39 2B9
38 GND
37 2OEBA
36 2LEBA
35 2CLKBA
34 TDI
33 TCK
description
The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of
the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std
1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) V_CC operation, but with the
capability to provide a TTL interface to a 5-V system environment.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1997, Texas Instruments Incorporated
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