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SN54HCT541 Datasheet, PDF (1/6 Pages) Texas Instruments – OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS
D Inputs Are TTL-Voltage Compatible
D High-Current 3-State Outputs Interface
Directly With System Bus or Can Drive up
to 15 LSTTL Loads
D Data Flow-Through Pinout (All Inputs on
Opposite Side From Outputs)
D Package Options Include Plastic
Small-Outline (DW) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These octal buffers and line drivers are designed
to have the performance of the popular ’HC240
series and to offer a pinout with inputs and outputs
on opposite sides of the package. This
arrangement greatly facilitates printed circuit
board layout.
The 3-state control gate is a 2-input NOR. If either
output-enable (OE1 or OE2) input is high, all eight
outputs are in the high-impedance state. The
’HCT541 provide true data at the outputs.
The SN54HCT541 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HCT541 is characterized for
operation from –40°C to 85°C.
SN54HCT541, SN74HCT541
OCTAL BUFFERS AND LINE DRIVERS
WITH 3-STATE OUTPUTS
SCLS306A – JANUARY 1996 – REVISED MAY 1997
SN54HCT541 . . . J OR W PACKAGE
SN74HCT541 . . . DW OR N PACKAGE
(TOP VIEW)
OE1 1
A1 2
A2 3
A3 4
A4 5
A5 6
A6 7
A7 8
A8 9
GND 10
20 VCC
19 OE2
18 Y1
17 Y2
16 Y3
15 Y4
14 Y5
13 Y6
12 Y7
11 Y8
SN54HCT541 . . . FK PACKAGE
(TOP VIEW)
A3
3 2 1 20 19
4
18
Y1
A4 5
17 Y2
A5 6
16 Y3
A6 7
15 Y4
A7 8
14 Y5
9 10 11 12 13
FUNCTION TABLE
(each buffer/driver)
INPUTS
OE1 OE2 A
OUTPUT
Y
L
L
L
L
L
L
H
H
H
X
X
Z
X
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1997, Texas Instruments Incorporated
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