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SN54HCT32_101 Datasheet, PDF (1/14 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-OR GATES
D Operating Voltage Range of 4.5 V to 5.5 V
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 20-µA Max ICC
SN54HCT32 . . . J OR W PACKAGE
SN74HCT32 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
SN54HCT32, SN74HCT32
QUADRUPLE 2-INPUT POSITIVE-OR GATES
SCLS064E – NOVEMBER 1988 – REVISED AUGUST 2003
D Typical tpd = 13 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D Inputs Are TTL-Voltage Compatible
SN54HCT32 . . . FK PACKAGE
(TOP VIEW)
1Y
3 2 1 20 19
4
18
4A
NC 5
17 NC
2A 6
16 4Y
NC 7
15 NC
2B 8
14 3B
9 10 11 12 13
description/ordering information
NC – No internal connection
The ’HCT32 devices contain four independent 2-input OR gates. They perform the Boolean function
+ + ) Y A • B or Y A B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – N
Tube of 25
SN74HCT32N
SN74HCT32N
Tube of 50
SN74HCT32D
SOIC – D
Reel of 2500 SN74HCT32DR
HCT32
–40°C to 85°C SOP – NS
Reel of 250
Reel of 2000
SN74HCT32DT
SN74HCT32NSR
HCT32
SSOP – DB
Reel of 2000 SN74HCT32DBR
HT32
Tube of 90
SN74HCT32PW
TSSOP – PW
Reel of 2000 SN74HCT32PWR
HT32
Reel of 250
SN74HCT32PWT
CDIP – J
Tube of 25
SNJ54HCT32J
SNJ54HCT32J
–55°C to 125°C CFP – W
Tube of 150
SNJ54HCT32W
SNJ54HCT32W
LCCC – FK
Tube of 55
SNJ54HCT32FK
SNJ54HCT32FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright  2003, Texas Instruments Incorporated
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