SN54HCT273 Datasheet, PDF (1/6 Pages) Texas Instruments – OCTAL D-TYPE FLIP-FLOPS WITH CLEAR

D Inputs Are TTL-Voltage Compatible
D Contain Eight D-Type Flip-Flops
D Direct Clear Input
D Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
D Package Options Include Plastic
Small-Outline (DW) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
SN54HCT273, SN74HCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS068C – NOVEMBER 1988 – REVISED MAY 1997
SN54HCT273 . . . J OR W PACKAGE
SN74HCT273 . . . DW, N, OR PW PACKAGE
(TOP VIEW)
CLR 1
1Q 2
1D 3
2D 4
2Q 5
3Q 6
3D 7
4D 8
4Q 9
GND 10
20 V_CC
19 8Q
18 8D
17 7D
16 7Q
15 6Q
14 6D
13 5D
12 5Q
11 CLK
These devices are positive-edge-triggered D-type
flip-flops with a common enable input. The
’HCT273 are similar to the ’HCT377, but feature
a common clear enable (CLR) input instead of a
latched clock.
Information at the data (D) inputs meeting the
setup time requirements is transferred to the
Q outputs on the positive-going edge of the clock
(CLK) pulse. Clock triggering occurs at a
particular voltage level and is not directly related
to the positive-going pulse. When CLK is at either
the high or low level, the D input has no effect at
the output. The circuits are designed to prevent
false clocking by transitions at CLR.
SN54HCT273 . . . FK PACKAGE
(TOP VIEW)
3 2 1 20 19
2D 4
18 8D
2Q 5
17 7D
3Q 6
16 _7Q
3D ⁷
15 _6Q
4D ⁸
14 _6D
9 10 11 12 13
The SN54HCT273 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HCT273 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each flip-flop)
INPUTS
CLR CLK D
OUTPUT
Q
L
X
X
L
H
↑
H
H
H
↑
L
L
H
L
X
Q0
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright © 1997, Texas Instruments Incorporated
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