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SN54HC4060 Datasheet, PDF (1/7 Pages) Texas Instruments – 14-STAGE ASYNCHRONOUS BINARY COUNTERS AND OSCILLATORS
SN54HC4060, SN74HC4060
14-STAGE ASYNCHRONOUS BINARY COUNTERS AND OSCILLATORS
D Allow Design of Either RC or Crystal
Oscillator Circuits
D Package Options Include Plastic
Small-Outline (D) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
The ’HC4060 consist of an oscillator section and
14 ripple-carry binary counter stages. The
oscillator configuration allows design of either RC
or crystal-oscillator circuits. A high-to-low
transition on the clock (CLKI) input increments the
counter. A high level at the clear (CLR) input
disables the oscillator (CLKO goes high and
CLKO goes low) and resets the counter to zero (all
Q outputs low).
The SN54HC4060 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC4060 is characterized for
operation from –40°C to 85°C.
logic symbol†
SCLS161B – DECEMBER 1982 – REVISED MAY 1997
SN54HC4060 . . . J OR W PACKAGE
SN74HC4060 . . . D OR N PACKAGE
(TOP VIEW)
QL 1
QM 2
QN 3
QF 4
QE 5
QG 6
QD 7
GND 8
16 VCC
15 QJ
14 QH
13 QI
12 CLR
11 CLKI
10 CLKO
9 CLKO
SN54HC4060 . . . FK PACKAGE
(TOP VIEW)
QN
3 2 1 20 19
4
18
QH
QF 5
17 QI
NC 6
16 NC
QE 7
15 CLR
QG
8
14
9 10 11 12 13
CLKI
12
CLR
11
CLKI
RCTR14
3
1+
CT
9
CT=0
11
13
&
Z1
7 QD
5
QE
4
QF
6
QG
14
QH
13
QI
15
QJ
1
2 QL
QM
3
QN
10
CLKO
9
CLKO
NC – No internal connection
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, N, and W packages.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1997, Texas Instruments Incorporated
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