SN54HC241 Datasheet, PDF (1/6 Pages) Texas Instruments – OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS

D 3-State Outputs Drive Bus Lines or Buffer
Memory Address Registers
D High-Current Outputs Drive up to 15 LSTTL
Loads
D Package Options Include Plastic
Small-Outline (DW) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These octal buffers and line drivers are designed
specifically to improve both the performance and
density of 3-state memory address drivers, clock
drivers, and bus-oriented receivers and
transmitters. The ’HC241 are organized as two
4-bit buffers/drivers with separate output-enable
(1OE and 2OE) inputs. When 1OE is low or 2OE
is high, the device passes noninverted data from
the A inputs to the Y outputs. When 1OE is high or
2OE is low, the outputs for the respective
buffers/drivers are in the high-impedance state.
The SN54HC241 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC241 is characterized for
operation from –40°C to 85°C.
SN54HC241, SN74HC241
OCTAL BUFFERS AND LINE DRIVERS
WITH 3-STATE OUTPUTS
SCLS300A – JANUARY 1996 – REVISED MAY 1997
SN54HC241 . . . J OR W PACKAGE
SN74HC241 . . . DW OR N PACKAGE
(TOP VIEW)
1OE ₁
1A1 ₂
2Y4 3
1A2 4
2Y3 5
1A3 6
2Y2 7
1A4 8
2Y1 9
GND 10
20 ^V_CC
19 ^2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y4
11 2A1
SN54HC241 . . . FK PACKAGE
(TOP VIEW)
1A2
3 2 1 20 19
4
18
1Y1
2Y3 ₅
17 ^2A4
1A3 6
16 1Y2
2Y2 7
15 2A3
1A4 8
14 1Y3
9 10 11 12 13
FUNCTION TABLES
INPUTS
1OE 1A
OUTPUT
1Y
L
H
H
L
L
L
H
X
Z
INPUTS
2OE 2A
H
H
H
L
L
X
OUTPUT
2Y
H
L
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1997, Texas Instruments Incorporated
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