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SN54HC175 Datasheet, PDF (1/6 Pages) Texas Instruments – QUADRUPLE D-TYPE FLIP-FLOPS WITH CLEAR
D Contain Four Flip-Flops With Double-Rail
Outputs
D Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
D Package Options Include Plastic
Small-Outline (D), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
SN54HC175, SN74HC175
QUADRUPLE D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS299A – JANUARY 1996 – REVISED MAY 1997
SN54HC175 . . . J OR W PACKAGE
SN74HC175 . . . D, N, OR PW PACKAGE
(TOP VIEW)
CLR 1
1Q 2
1Q 3
1D 4
2D 5
2Q 6
2Q 7
GND 8
16 VCC
15 4Q
14 4Q
13 4D
12 3D
11 3Q
10 3Q
9 CLK
description
These monolithic positive-edge-triggered D-type
flip-flops have a direct clear (CLR) input. The
’HC175 feature complementary outputs from
each flip-flop.
Information at the data (D) inputs meeting the
setup time requirements is transferred to the
outputs on the positive-going edge of the clock
(CLK) pulse. Clock triggering occurs at a
particular voltage level and is not directly related
to the transition time of the positive-going edge of
CLK. When CLK is at either the high or low level,
the D input has no effect at the output.
The SN54HC175 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC175 is characterized for
operation from –40°C to 85°C.
SN54HC175 . . . FK PACKAGE
(TOP VIEW)
3 2 1 20 19
1Q 4
18 4Q
1D 5
17 4D
NC 6
16 NC
2D 7
15 3D
2Q 8
14 3Q
9 10 11 12 13
NC – No internal connection
FUNCTION TABLE
(each flip-flop)
INPUTS
OUTPUTS
CLR CLK D
Q
Q
L
X
X
L
H
H
↑
H
H
L
H
↑
L
L
H
H
L
X
Q0 Q0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1997, Texas Instruments Incorporated
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