SN54BCT8374A Datasheet, PDF (1/26 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Octal Test-Integrated Circuits
D Functionally Equivalent to ’F374 and
’BCT374 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/ Toggle Outputs
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs
description
The ’BCT8374A scan test devices with octal
edge-triggered D-type flip-flops are members of
the Texas Instruments SCOPE™ testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
SN54BCT8374A . . . JT PACKAGE
SN74BCT8374A . . . DW OR NT PACKAGE
(TOP VIEW)
CLK 1
1Q 2
2Q 3
3Q 4
4Q 5
GND 6
5Q 7
6Q 8
7Q 9
8Q 10
TDO 11
TMS 12
24 OE
23 1D
22 2D
21 3D
20 4D
19 5D
18 V_CC
17 6D
16 7D
15 8D
14 TDI
13 TCK
SN54BCT8374A . . . FK PACKAGE
(TOP VIEW)
2D
1D
OE
NC
CLK
1Q
2Q
4 3 2 1 28 27 26
5
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
8D
TDI
TCK
NC
TMS
TDO
8Q
NC – No internal connection
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect
the functional operation of the SCOPE™ octal flip-flops.
In the test mode, the normal operation of the SCOPE™ octal flip-flops is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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