SN54BCT8373A Datasheet, PDF (1/26 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES
WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Octal Test-Integrated Circuits
D Functionally Equivalent to ’F373 and
’BCT373 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs / Toggle Outputs
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
and Ceramic 300-mil DIPs (JT, NT)
description
The ’BCT8373A scan test devices with octal
D-type latches are members of the Texas
Instruments SCOPE™ testability integrated-
circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
SN54BCT8373A . . . JT PACKAGE
SN74BCT8373A . . . DW OR NT PACKAGE
(TOP VIEW)
LE 1
1Q 2
2Q 3
3Q 4
4Q 5
GND 6
5Q 7
6Q 8
7Q 9
8Q 10
TDO 11
TMS 12
24 OE
23 1D
22 2D
21 3D
20 4D
19 5D
18 V_CC
17 6D
16 7D
15 8D
14 TDI
13 TCK
SN54BCT8373A . . . FK PACKAGE
(TOP VIEW)
4 3 2 1 28 27 26
2D ⁵
25 8D
1D ⁶
24 TDI
OE ⁷
23 TCK
NC ⁸
22 NC
LE ⁹
21 TMS
1Q ¹⁰
20 TDO
2Q ¹¹
19 8Q
12 13 14 15 16 17 18
NC – No internal connection
In the normal mode, these devices are functionally equivalent to the ’F373 and ’BCT373 octal D-type latches.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device
terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect
the functional operation of the SCOPE™ octal latches.
In the test mode, the normal operation of the SCOPE™ octal latches is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary
scan test operations, as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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