SN54BCT8244A Datasheet, PDF (1/26 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL BUFFERS

SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E – FEBRUARY 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE™ Family of Testability Products
D Octal Test-Integrated Circuits
D Functionally Equivalent to ’F244 and
’BCT244 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
D SCOPE™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
and Ceramic 300-mil DIPs (JT, NT)
description
The ’BCT8244A scan test devices with octal
buffers are members of the Texas Instruments
SCOPE™ testability integrated-circuit family. This
family of devices supports IEEE Standard
1149.1-1990 boundary scan to facilitate testing of
complex circuit-board assemblies. Scan access
to the test circuitry is accomplished via the 4-wire
test access port (TAP) interface.
SN54BCT8244A . . . JT PACKAGE
SN74BCT8244A . . . DW OR NT PACKAGE
(TOP VIEW)
1OE 1
1Y1 2
1Y2 3
1Y3 4
1Y4 5
GND 6
2Y1 7
2Y2 8
2Y3 9
2Y4 10
TDO 11
TMS 12
24 2OE
23 1A1
22 1A2
21 1A3
20 1A4
19 2A1
18 V_CC
17 2A2
16 2A3
15 2A4
14 TDI
13 TCK
SN54BCT8244A . . . FK PACKAGE
(TOP VIEW)
1A2
1A1
2OE
NC
1OE
1Y1
1Y2
4 3 2 1 28 27 26
5
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
2A4
TDI
TCK
NC
TMS
TDO
2Y4
NC – No internal connection
In the normal mode, these devices are functionally equivalent to the ’F244 and ’BCT244 octal buffers. The test
circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE™ octal buffers.
In the test mode, the normal operation of the SCOPE™ octal buffers is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations, as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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