SN54AS250A_07 Datasheet, PDF (1/13 Pages) Texas Instruments – 1-OF-16 DATA GENERATORS/MULTIPLEXERS WITH 3-STATE OUTPUTS

SN54AS250A, SN74AS250A
1-OF-16 DATA GENERATORS/MULTIPLEXERS
WITH 3-STATE OUTPUTS
SDAS137A – DECEMBER 1983 – REVISED DECEMBER 1994
• 4-Line to 1-Line Multiplexers That Can
Select 1-of-16 Data Inputs
• Applications:
Boolean Function Generator
Parallel-to-Serial Converter
Data Source Selector
• Buffered 3-State Bus Driver Inputs Permit
Multiplexing From n Lines to One Line
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs
description
The ′AS250A devices provide full binary decoding
to select 1-of-16 data inputs or use sources as an
input with an inverting W output. The selected
sources are buffered with symmetrical
propagation delay times. This reduces the
possibility of transients occurring at the output.
SN54AS250A . . . JT PACKAGE
SN74AS250A . . . DW OR NT PACKAGE
(TOP VIEW)
E7 ₁
E6 ₂
E5 ₃
E4 4
E3 5
E2 6
E1 7
E0 8
OE 9
W 10
D 11
GND 12
24 ^V_CC
23 ^E8
22 ^E9
21 E10
20 E11
19 E12
18 E13
17 E14
16 E15
15 A
14 B
13 C
SN54AS250A . . . FK PACKAGE
(TOP VIEW)
A buffered output-enable (OE) input can be used
for n-line to 1-line cascading. Taking OE high
places the output in the high-impedance state. In
the high-impedance state, the output neither loads
nor drives the bus lines significantly.
OE does not affect the internal operations of the
data selector/multiplexer. New data can be set up
while the outputs are disabled.
The SN54AS250A is characterized for operation
over the full military temperature range of – 55°C
to 125°C. The SN74AS250A is characterized for
operation from 0°C to 70°C.
4 3 2 1 28 27 26
E4 5
25 E10
E3 6
24 E11
E2 7
23 E12
NC 8
22 NC
E1 9
21 E13
E0 10
20 E14
OE 11
19 E15
12 13 14 15 16 17 18
NC – No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1994, Texas Instruments Incorporated
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