SN54ALS576B Datasheet, PDF (1/18 Pages) Texas Instruments – OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS

SN54ALS576B, SN54AS576
SN74ALS576B, SN74ALS577A, SN74AS576
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS
SDAS065B – DECEMBER 1982 – REVISED JANUARY 1995
• 3-State Buffer-Type Inverting Outputs Drive
Bus Lines Directly
• Bus-Structured Pinout
• Buffered Control Inputs
• SN74ALS577A Has Synchronous Clear
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), Standard Plastic (N, NT)
and Ceramic (J) 300-mil DIPs, and Ceramic
Flat (W) Packages
description
These octal D-type edge-triggered flip-flops
feature 3-state outputs designed specifically for
bus driving. They are particularly suitable for
implementing buffer registers, I/O ports,
bidirectional bus drivers, and working registers.
SN54ALS576B, SN54AS576 . . . J OR W PACKAGE
SN74ALS576B, SN74AS576 . . . DW OR N PACKAGE
(TOP VIEW)
OE ₁
1D ₂
2D 3
3D 4
4D 5
5D 6
6D 7
7D 8
8D 9
GND 10
20 ^V_CC
19 ^1Q
18 2Q
17 3Q
16 4Q
15 5Q
14 6Q
13 7Q
12 8Q
11 CLK
SN54ALS576B, SN54AS576 . . . FK PACKAGE
(TOP VIEW)
These flip-flops enter data on the low-to-high
transition of the clock (CLK) input.
The output-enable (OE) input does not affect
internal operations of the flip-flops. Old data can
be retained or new data can be entered while the
outputs are disabled.
The SN54ALS576B and SN54AS576 are
characterized for operation over the full military
temperature range of – 55°C to 125°C. The
SN74ALS576B,
SN74ALS577A,
and
SN74AS576 are characterized for operation from
0°C to 70°C.
3D
3 2 1 20 19
4
18
2Q
4D ₅
17 ^3Q
5D 6
16 4Q
6D 7
15 5Q
7D 8
14 6Q
9 10 11 12 13
SN74ALS577A . . . DW OR NT PACKAGE
(TOP VIEW)
CLR 1
OE 2
1D 3
2D 4
3D 5
4D 6
5D 7
6D 8
7D 9
8D 10
NC 11
GND 12
24 V_CC
23 NC
22 1Q
21 2Q
20 3Q
19 4Q
18 5Q
17 6Q
16 7Q
15 8Q
14 CLK
13 NC
NC – No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1995, Texas Instruments Incorporated
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