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SN54AHCT02 Datasheet, PDF (1/6 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SN54AHCT02, SN74AHCT02
QUADRUPLE 2-INPUT POSITIVE-NOR GATES
D EPIC™ (Enhanced-Performance Implanted
CMOS) Process
D Inputs Are TTL-Voltage Compatible
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
SCLS262I – DECEMBER 1995 – REVISED JANUARY 2000
SN54AHCT02 . . . J OR W PACKAGE
SN74AHCT02 . . . D, DB, DGV, N, OR PW PACKAGE
(TOP VIEW)
1Y 1
1A 2
1B 3
2Y 4
2A 5
2B 6
GND 7
14 VCC
13 4Y
12 4B
11 4A
10 3Y
9 3B
8 3A
SN54AHCT02 . . . FK PACKAGE
(TOP VIEW)
description
These devices contain four independent 2-input
NOR gates that perform the Boolean function
Y = A S B or Y = A + B in positive logic.
The SN54AHCT02 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74AHCT02 is characterized for
operation from –40°C to 85°C.
1B
3 2 1 20 19
4
18
4B
NC 5
17 NC
2Y 6
16 4A
NC 7
15 NC
2A 8
14 3Y
9 10 11 12 13
NC – No internal connection
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
X
L
X
H
L
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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