SN54ACT241 Datasheet, PDF (1/5 Pages) Texas Instruments – OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

D Inputs Are TTL Compatible
D EPIC ™ (Enhanced-Performance Implanted
CMOS) 1-µm Process
D Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW), and
DIP (N) Packages, Ceramic Chip Carriers
(FK), Flat (W), and DIP (J) Packages
description
These octal buffers and line drivers are designed
specifically to improve the performance and
density of 3-state memory address drivers, clock
drivers, and bus-oriented receivers and
transmitters.
The ’ACT241 are organized as two 4-bit
buffers/drivers with separate complementary
output-enable (1OE and 2OE) inputs. When 1OE
is low or 2OE is high, the device passes
noninverted data from the A inputs to the
Y outputs. When 1OE is high or 2OE is low, the
outputs are in the high-impedance state.
The SN54ACT241 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74ACT241 is characterized for
operation from –40°C to 85°C.
SN54ACT241, SN74ACT241
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS516B – JUNE 1995 – REVISED MAY 1996
SN54ACT241 . . . J OR W PACKAGE
SN74ACT241 . . . DB, DW, N, OR PW PACKAGE
(TOP VIEW)
1OE ₁
1A1 ₂
2Y4 3
1A2 4
2Y3 5
1A3 6
2Y2 7
1A4 8
2Y1 9
GND 10
20 ^V_CC
19 ^2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y4
11 2A1
SN54ACT241 . . . FK PACKAGE
(TOP VIEW)
3 2 1 20 19
1A2 4
18 1Y1
2Y3 5
17 2A4
1A3 6
16 1Y2
2Y2 7
15 2A3
1A4 ⁸
14 _1Y3
9 10 11 12 13
FUNCTION TABLES
INPUTS
1OE 1A
OUTPUT
1Y
L
H
H
L
L
L
H
X
Z
INPUTS
2OE 2A
H
H
H
L
L
X
OUTPUT
2Y
H
L
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
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