SN54ACT11 Datasheet, PDF (1/5 Pages) Texas Instruments – TRIPLE 3-INPUT POSITIVE-AND GATES

SN54ACT11, SN74ACT11
TRIPLE 3-INPUT POSITIVE-AND GATES
D Inputs Are TTL-Voltage Compatible
D EPIC ™ (Enhanced-Performance Implanted
CMOS) 1-µm Process
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), and Thin Shrink Small-Outline (PW)
Packages, Ceramic Chip Carriers (FK) and
Flatpacks (W), and Standard Plastic (N) and
Ceramic (J) DIPS
description
The ’ACT11 contain three independent 3-input
AND gates. The devices perform the Boolean
functions Y = A • B • C or Y = A + B + C in positive
logic.
The SN54ACT11 is characterized for operation
over the full military temperature range of – 55°C
to 125°C. The SN74ACT11 is characterized for
operation from – 40°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
A
B
C
OUTPUT
Y
H
H
H
H
L
X
X
L
X
L
X
L
X
X
L
L
SCAS531A – AUGUST 1995 – REVISED APRIL 1996
SN54ACT11 . . . J OR W PACKAGE
SN74ACT11 . . . D, DB, N, OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
2A 3
2B 4
2C 5
2Y 6
GND 7
14 V_CC
13 1C
12 1Y
11 3A
10 3B
9 3C
8 3Y
SN54ACT11 . . . FK PACKAGE
(TOP VIEW)
2A
3 2 1 20 19
4
18
1Y
NC ₅
17 ^NC
2B 6
16 3A
NC 7
15 NC
2C 8
14 3B
9 10 11 12 13
NC – No internal connection
logic symbol^†
logic diagram, each gate (positive logic)
1
1A
2
1B
13
&
12
1Y
1A ¹
1B ²
1C ¹³
1C
3
2A
4
2B
5
2C
11
3A
10
3B
6
2Y
8
3Y
2A ³
2B
2C
4
5
3A ¹¹
3B ¹⁰
3C ⁹
9
3C
12 _1Y
6
2Y
8 _3Y
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and}
IEC Publication 617-12.
Pin numbers shown are for the D, DB, J, N, PW, and W packages.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
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