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SN54ACT04_10 Datasheet, PDF (1/17 Pages) Texas Instruments – HEX INVERTERS
D 4.5-V to 5.5-V VCC Operation
D Inputs Accept Voltages to 5.5 V
SN54ACT04 . . . J OR W PACKAGE
SN74ACT04 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1A 1
1Y 2
2A 3
2Y 4
3A 5
3Y 6
GND 7
14 VCC
13 6A
12 6Y
11 5A
10 5Y
9 4A
8 4Y
SN54ACT04, SN74ACT04
HEX INVERTERS
SCAS518C − JULY 1995 − REVISED OCTOBER 2003
D Max tpd of 8.5 ns at 5 V
D Inputs Are TTL-Voltage Compatible
SN54ACT04 . . . FK PACKAGE
(TOP VIEW)
2A
3 2 1 20 19
4
18
6Y
NC 5
17 NC
2Y 6
16 5A
NC 7
15 NC
3A 8
14 5Y
9 10 11 12 13
description/ordering information
NC − No internal connection
The ‘ACT04 devices contain six independent inverters. The devices perform the Boolean function Y = A.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP − N
Tube
SN74ACT04N
SN74ACT0N
SOIC − D
Tube
Tape and reel
SN74ACT04D
SN74ACT04DR
ACT04
−40°C to 85°C
SOP − NS
SSOP − DB
Tape and reel
Tape and reel
SN74ACT04NSR
SN74ACT04DBR
ACT04
AD04
TSSOP − PW
Tube
Tape and reel
SN74ACT04PW
SN74ACT04PWR
AD04
CDIP − J
−55°C to 125°C CFP − W
Tube
Tube
SNJ54ACT04J
SNJ54ACT04W
SNJ54ACT04J
SNJ54ACT04W
LCCC − FK
Tube
SNJ54ACT04FK
SNJ54ACT04FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each inverter)
INPUT
A
OUTPUT
Y
H
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright  2003, Texas Instruments Incorporated
On products compliant to MILĆPRFĆ38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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