SN54ACT00 Datasheet, PDF (1/5 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NAND GATES

SN54ACT00, SN74ACT00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
D Inputs Are TTL-Voltage Compatible
D EPIC ™ (Enhanced-Performance Implanted
CMOS) 1-µm Process
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW), DIP
(N) Packages, Ceramic Chip Carriers (FK),
Flat (W), and DIP (J) Packages
description
The ‘ACT00 devices contain four independent 2-input
NAND gates. Each gate performs the Boolean
function of Y = A S B or Y = A + B in positive logic.
The SN54ACT00 is characterized for operation over
the full military temperature range of – 55°C to 125°C.
The SN74ACT00 is characterized for operation from
– 40°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
A
B
H
H
L
X
X
L
OUTPUT
Y
L
H
H
SCAS523B – AUGUST 1995 – REVISED AUGUST 1999
SN54ACT00 . . . J OR W PACKAGE
SN74ACT00 . . . D, DB, N, OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 V_CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
SN54ACT00 . . . FK PACKAGE
(TOP VIEW)
1Y
3 2 1 20 19
4
18
4A
NC ₅
17 ^NC
2A ₆
16 4Y
NC 7
15 NC
2B 8
14 3B
9 10 11 12 13
NC – No internal connection
logic symbol^†
1
1A
&
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
3
1Y
6
2Y
8
3Y
11
4Y
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and}
IEC Publication 617-12.
Pin numbers shown are for the D, DB, J, N, PW, and W packages.
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1999, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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